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DEPENDANCE OF STRUCTURAL AND MORPHOLOGICAL PROPERTIES
ON Se CONCENTRATION FOR THIN Cu2ZnSn((SexS1–x))4 FILMS

 

Abstract
Cu2ZnSn(SexS1-x)4 alloys were prepared at various Se concentration (x=0.0, 0.25, 0.50, 0.75 and 1.0) ,then films from these prepared alloys have been deposited by thermal evaporation technique on glass substrate. These thin films were deposited at substrate temperature equal to 413K under vacuum of 10-5 Torr with thickness equal to 750 nm.
The prepared thin films were annealed at different annealing temperatures (573,673 and 773 K). Structural characteristics of prepared Cu2ZnSn(SexS1-x)4 alloys and films have been studied by X-ray diffraction (XRD) and atomic force microscopy(AFM). The X–ray pattern showed that the structure for prepared alloys and films were polycrystalline with tetragonal and preferential orientation in (112) direction.
Atomic force microscopy images demonstrated that the grain size for thin Cu2ZnSn(SexS1-x)4 films increased with Se concentration. Upon annealing films at different temperatures, a relatively there were more intense and sharper diffraction peaks (112), (200), (220) and (312) of polycrystalline structure.
Key words: Cu2ZnSn(SexS1-x)4 alloys and thin films, thermal evaporation, structural and morphological properties

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