Influence of Copper Content on Structural and Optical Properties of Cu2(x)Zn(1-x)S Thin Films

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Influence of Copper Content on Structural and
Optical Properties of Cu2(x)Zn(1-x)S Thin Films

Abstract: Cu2(x)Zn(1-x)Salloy was synthesized by reacting high purity elements Cu, Zn, and Swith ratios of Cu x= (0.0), (0.25), (0.50), (0.75) and (1.0) in an evacuated quartz ampoule. Cu2(x)Zn(1-x)S thin films have been prepared by vacuum thermal evaporation method from the Cu2(x)Zn(1-x)Salloy. The thin films were deposited onto glass substrates undervacuum pressureof 10-5torrwith thickness of 500
nm. The analysis of structural and optical properties of the Cu2(x)Zn(1-x)S thin filmswere carried out by X-ray diffraction (XRD) and UV-
Vis Spectrophotometer. The X-Ray diffraction method was utilized to test theCu2(x)Zn(1-x)S film. It was found that the filmshad a
polycrystalline structurewith cubic phase and that the average crystal size varied from (253 ) A0 to (348) A0. The study of the optical properties were carried outwithin a range of wavelength between (200nm) and (1100nm). The average transmission of the films was about (70-90)%. It was decreasingwiththe increasing of copper concentration (x). The value of absorbancewas very dependent on copper concentration in thin films as the absorbance was proportional with the increase in copper concentrate. The absorption coefficient ()
and optical energy gapwere measured for direct electronic transitions.And the film energy band gap was in the range of (3.10-2.08)eV,
depending on the materialof the thin film and the concentration of copper. Finally, the extinction coefficient; refractive indexand dielectric constant were measured for all thin films. The refractive indexand dielectric constant,at first, increased with the increase of wavelenghtand reachedthe largest possible value and then they decreased with the increaseof wavelenght. The refractive index varied between (1.2) and(2.6).

Keywords: Structural and Optical Properties, Cu2(x)Zn(1-x)S thin films

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